Memory Built-In Self-Repair using redundant words
- authored by
- Volker Schöber, Steffen Paul, Olivier Picot
- Abstract
A word oriented memory Built-In Self-Repair methodology is described without modifying the memory module. Faulty addresses and its data will be stored in the redundancy logic immediately after its detection during test. Fuse boxes can be connected via scan registers to the redundancy logic.
- External Organisation(s)
-
Infineon Technologies AG
- Type
- Article
- Journal
- IEEE International Test Conference (TC)
- Volume
- 2001
- Pages
- 995-1001
- No. of pages
- 7
- ISSN
- 1089-3539
- Publication date
- 01.01.2001
- Publication status
- Published
- Peer reviewed
- Yes
- ASJC Scopus subject areas
- Electrical and Electronic Engineering, Applied Mathematics
- Electronic version(s)
-
https://doi.org/10.1109/TEST.2001.966724 (Access:
Unknown)
