The Heidelberg compact electron beam ion traps

verfasst von: Peter Micke, Steffen Kühn, Lisa Buchauer, James Robert Harries, Thore M. Bücking, Klaus Blaum, A. Cieluch, Alexander Egl, Daniel Hollain, Sandro Kraemer, Thomas Pfeifer, Piet Oliver Schmidt, R. X. Schüssler, Ch Schweiger, T. Stöhlker, Sven Sturm, Robert N. Wolf, Sven Bernitt, José R. Crespo López-Urrutia
Abstract: Electron beam ion traps (EBITs) are ideal tools for both production and study of highly charged ions (HCIs). In order to reduce their construction, maintenance, and operation costs, we have developed a novel, compact, room-temperature design, the Heidelberg Compact EBIT (HC-EBIT). Four already commissioned devices operate at the strongest fields (up to 0.86 T) reported for such EBITs using permanent magnets, run electron beam currents up to 80 mA, and energies up to 10 keV. They demonstrate HCI production, trapping, and extraction of pulsed Ar¹⁶⁺ bunches and continuous 100 pA ion beams of highly charged Xe up to charge state 29+, already with a 4 mA, 2 keV electron beam. Moreover, HC-EBITs offer large solid-angle ports and thus high photon count rates, e.g., in x-ray spectroscopy of dielectronic recombination in HCIs up to Fe²⁴⁺, achieving an electron-energy resolving power of E/ΔE > 1500 at 5 keV. Besides traditional on-axis electron guns, we have also implemented a novel off-axis gun for laser, synchrotron, and free-electron laser applications, offering clear optical access along the trap axis. We report on its first operation at a synchrotron radiation facility demonstrating the resonant photoexcitation of highly charged oxygen.
Organisationseinheit(en): Institut für Quantenoptik
Externe Organisation(en): Max-Planck-Institut für Kernphysik
Physikalisch-Technische Bundesanstalt (PTB)
National Institutes for Quantum and Radiological Science and Technology
GSI Helmholtzzentrum für Schwerionenforschung GmbH
Helmholtz-Institut Jena
Friedrich-Schiller-Universität Jena
Typ: Artikel
Journal: Review of Scientific Instruments
Band: 89
ISSN: 0034-6748
Publikationsdatum: 06.2018
Publikationsstatus: Veröffentlicht
Peer-reviewed: Ja
ASJC Scopus Sachgebiete: Instrumentierung
Elektronische Version(en): https://doi.org/10.48550/arXiv.2011.01363 (Zugang: Offen)
https://doi.org/10.1063/1.5026961 (Zugang: Offen)
https://doi.org/10.15488/4920 (Zugang: Offen)

BibTeX

@article{f25973e3290a432e9529125b312926f9,
title = "The Heidelberg compact electron beam ion traps",
abstract = "Electron beam ion traps (EBITs) are ideal tools for both production and study of highly charged ions (HCIs). In order to reduce their construction, maintenance, and operation costs, we have developed a novel, compact, room-temperature design, the Heidelberg Compact EBIT (HC-EBIT). Four already commissioned devices operate at the strongest fields (up to 0.86 T) reported for such EBITs using permanent magnets, run electron beam currents up to 80 mA, and energies up to 10 keV. They demonstrate HCI production, trapping, and extraction of pulsed Ar16+ bunches and continuous 100 pA ion beams of highly charged Xe up to charge state 29+, already with a 4 mA, 2 keV electron beam. Moreover, HC-EBITs offer large solid-angle ports and thus high photon count rates, e.g., in x-ray spectroscopy of dielectronic recombination in HCIs up to Fe24+, achieving an electron-energy resolving power of E/ΔE > 1500 at 5 keV. Besides traditional on-axis electron guns, we have also implemented a novel off-axis gun for laser, synchrotron, and free-electron laser applications, offering clear optical access along the trap axis. We report on its first operation at a synchrotron radiation facility demonstrating the resonant photoexcitation of highly charged oxygen.",
author = "Peter Micke and Steffen K{\"u}hn and Lisa Buchauer and Harries, {James Robert} and B{\"u}cking, {Thore M.} and Klaus Blaum and A. Cieluch and Alexander Egl and Daniel Hollain and Sandro Kraemer and Thomas Pfeifer and Schmidt, {Piet Oliver} and Sch{\"u}ssler, {R. X.} and Ch Schweiger and T. St{\"o}hlker and Sven Sturm and Wolf, {Robert N.} and Sven Bernitt and {Crespo L{\'o}pez-Urrutia}, {Jos{\'e} R.}",
note = "Funding information: For their expertise and competent fabrication of numerous parts, we gratefully acknowledge the MPIK engineering design office headed by Frank M{\"u}ller, the MPIK mechanical workshop led by Thorsten Spranz, the MPIK mechanical apprenticeship workshop led by Stefan Flicker and Florian S{\"a}ubert, and the MPIK electronics apprenticeship workshop as well as electronics workshop with Jochen Stephan and Thomas Busch. Likewise, we acknowledge the PTB scientific instrumentation department 5.5 headed by Frank L{\"o}ffler; in particular, we thank Stephan Metschke. We also appreciate expeditious technical help by Christian Kaiser. Financial support was provided by the Max-Planck-Gesellschaft, in particular, through IMPRS-PTFS and IMPRS-QD, the Physikalisch-Technische Bundesanstalt, the Bundesministerium f{\"u}r Bildung und Forschung through Project No. 05K13SJ2, the Deutsche Forschungsgemeinschaft through SFB 1225 ISOQUANT and No. SCHM2678/5-1, and JSPS Grants-in-Aid for Scientific Research through Nos. 24740278 and 15K04707.",
year = "2018",
month = jun,
doi = "10.48550/arXiv.2011.01363",
language = "English",
volume = "89",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics",
number = "6",
}